Identification of fragment ions produced by the decomposition of tetramethyltin and the production of low-energy Sn+ ion beam.

Identification of fragment ions produced by the decomposition of tetramethyltin and the production of low-energy Sn+ ion beam.

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Tetramethyltin was decomposed in an ion source and the fragment ions produced were identified using a low-energy mass-selected ion beam machine.Dominant fragment ions were found to be H+, CH2+, and Sn+.Subsequently, fragment ions were mass-selected.The mass spectrum of the selected ions indicated that only a duospiritalis.com single peak appeared at the mass number of 120 u, being suggestive of the presence of 120Sn+ ions.The ion energy was set at the range of 20-100 eV.

The Sn+ ion beam was irradiated to a Si substrate, and a film was then found deposited on the substrate after the echofix spring reverb ion beam irradiation.An X-ray diffraction measurement showed that the film obtained was metallic Sn.Then, the Sn+ ion beam was irradiated to a quartz crystal microbalance substrate.We found that most of the irradiated Sn+ ions were adhered to the substrate, at the ion energy levels of 25 and 58 eV, producing the Sn film, whereas a 107 eV Sn+ beam caused a significant proportion of Sn atoms in the film to detach from the substrate, probably due to sputtering.